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Inductance deep-level transient spectroscopy for determining temperature-dependent resistance and capacitance of Schottky diodes

Inductance deep-level transient spectroscopy for determining temperature-dependent resistance and capacitance of Schottky diodes

Rangel-Kuoppa, V. T.; Pessa, M.
  • 期刊名称Review of Scientific Instruments
  • 作者Rangel-Kuoppa, V. T.; Pessa, M.
  • 卷第74卷
  • 期第10期
  • 印刷ISSN0034-6748
  • 文件大小57.03KB
  • 发表时间2003
  • DOI10.1063/1.1610786
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