A capacitance–voltage model for polysilicon-gated MOS devices including substrate quantization effects based on modification of the total semiconductor charge
Eric M. Vogel; Curt A. Richter; Brian G. Rennex
- 作者Eric M. Vogel; Curt A. Richter; Brian G. Rennex
- 卷第47卷
- 期第9期
- 印刷ISSN0038-1101
- 文件大小366.62KB
- 发表时间2003
- DOI10.1016/s0038-1101(03)00099-6
- 页码1589-1596