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[ACM Press the 2003 international symposium - Seoul, Korea (2003.08.25-2003.08.27)] Proceedings of the 2003 international symposium on Low power electronics and design - ISLPED '03 - Statistical estimation of leakage current considering inter- and intra-die process variation

[ACM Press the 2003 international symposium - Seoul, Korea (2003.08.25-2003.08.27)] Proceedings of the 2003 international symposium on Low power electronics and design - ISLPED '03 - Statistical estimation of leakage current considering inter- and intra-die process variation

Rao, Rajeev; Srivastava, Ashish; Blaauw, David; Sylvester, Dennis

作者Rao, Rajeev; Srivastava, Ashish; Blaauw, David; Sylvester, Dennis
文件大小299.38KB
发表时间2003
DOI10.1145/871506.871530

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