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BIST and production testing of ADCs using imprecise stimulus

Parthasarathy, Kumar; Kuyel, Turker; Price, Dana; Jin, Le; Chen, Degang; Geiger, Randall

期刊名称ACM Transactions on Design Automation of Electronic Systems
作者Parthasarathy, Kumar; Kuyel, Turker; Price, Dana; Jin, Le; Chen, Degang; Geiger, Randall
卷第8卷
期第4期
印刷ISSN1084-4309
文件大小488.61KB
发表时间2003-10-01
DOI10.1145/944027.944035
页码522-545