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Structural characterization of ZnO films grown on SiO2 by the RF magnetron sputtering

Structural characterization of ZnO films grown on SiO2 by the RF magnetron sputtering

Kwang Sik Kim; Hyoun Woo Kim; Nam Ho Kim

作者Kwang Sik Kim; Hyoun Woo Kim; Nam Ho Kim
卷第334卷
印刷ISSN0921-4526
文件大小390.51KB
发表时间2003
DOI10.1016/s0921-4526(03)00096-6
页码343-346

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