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[IEEE 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) - Vail, Colorado, USA (20-22 May 2003)] Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) - Immunity of a virtual instrument to radiated electromagnetic disturbances

[IEEE 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) - Vail, Colorado, USA (20-22 May 2003)] Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) - Immunity of a virtual instrument to radiated electromagnetic disturbances

Nuccio, S.; Spataro, C.; Tine, G.

作者Nuccio, S.; Spataro, C.; Tine, G.
卷第1卷
文件大小385.52KB
发表时间2003
DOI10.1109/imtc.2003.1208262
页码780-784

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