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[IEEE International Test Conference, 2003. ITC 2003. - Washington, DC, USA (Sept. 30-Oct. 2, 2003)] International Test Conference, 2003. Proceedings. ITC 2003. - First ic validation of IEEE Std. 1149.6

[IEEE International Test Conference, 2003. ITC 2003. - Washington, DC, USA (Sept. 30-Oct. 2, 2003)] International Test Conference, 2003. Proceedings. ITC 2003. - First ic validation of IEEE Std. 1149.6

Vandivier, S.; Wahl, M.; Rearick, J.

作者Vandivier, S.; Wahl, M.; Rearick, J.
卷第1卷
文件大小924.19KB
发表时间2003
DOI10.1109/test.2003.1270890
页码632-639

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