SPIE Proceedings [SPIE SPIE's First International Symposium on Fluctuations and Noise - Santa Fe, NM (Sunday 1 June 2003)] Noise and Information in Nanoelectronics, Sensors, and Standards - Current noise in diffusive S/N and S/N/S junctions
- 作者Hoffmann, Christian; Lefloch, Francois; Quirion, David; Sanquer, Marc; Kish, Laszlo B.; Green, Frederick; Iannaccone, Giuseppe; Vig, John R.
- 卷第5115卷
- 印刷ISSN0277-786X
- 文件大小316.54KB
- 发表时间2003
- DOI10.1117/12.488987
- 页码20-30
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