SPIE Proceedings [SPIE OPTO Ireland - Galway, Ireland (Thursday 5 September 2002)] Opto-Ireland 2002: Optical Metrology, Imaging, and Machine Vision - <title>Wavelet- and entropy-based feature extraction: application to distinguishing mixtures of beverages</title>

SPIE Proceedings [SPIE OPTO Ireland - Galway, Ireland (Thursday 5 September 2002)] Opto-Ireland 2002: Optical Metrology, Imaging, and Machine Vision - Wavelet- and entropy-based feature extraction: application to distinguishing mixtures of beverages

Kokuer, Munevver; Murtagh, Fionn D.; Augousti, Andreas T.; Mason, Julian; McMillan, Norman D.; Shearer, Andrew; Murtagh, Fionn D.; Mahon, James; Whelan, Paul F.

作者Kokuer, Munevver; Murtagh, Fionn D.; Augousti, Andreas T.; Mason, Julian; McMillan, Norman D.; Shearer, Andrew; Murtagh, Fionn D.; Mahon, James; Whelan, Paul F.
卷第4877卷
印刷ISSN0277-786X
文件大小538.89KB
发表时间2003
DOI10.1117/12.463733
页码175-182

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SPIE Proceedings [SPIE OPTO Ireland - Galway, Ireland (Thursday 5 September 2002)] Opto-Ireland 2002: Optical Metrology, Imaging, and Machine Vision - Wavelet- and entropy-based feature extraction: application to distinguishing mixtures of beverages