SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, CA (Sunday 3 August 2003)] Polarization Science and Remote Sensing - Active detection of off-diagonal Mueller elements of rough targets
Hoover, Brian G.; Dayton, David C.; Havey, Jason E.; Gonglewski, John D.; Gamiz, Victor L.; Ulibarri, Laura J.; Shaw, Joseph A.; Tyo, J. Scott
- 作者Hoover, Brian G.; Dayton, David C.; Havey, Jason E.; Gonglewski, John D.; Gamiz, Victor L.; Ulibarri, Laura J.; Shaw, Joseph A.; Tyo, J. Scott
- 卷第5158卷
- 印刷ISSN0277-786X
- 文件大小804.83KB
- 发表时间2003
- DOI10.1117/12.507350
- 页码226-238