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SPIE Proceedings [SPIE Optoelectronic and Electronic Sensors V - Rzeszow, Poland (Wednesday 5 June 2002)] Optoelectronic and Electronic Sensors V - <title>Microsystem for measurement of impedance sensors parameters</title>

SPIE Proceedings [SPIE Optoelectronic and Electronic Sensors V - Rzeszow, Poland (Wednesday 5 June 2002)] Optoelectronic and Electronic Sensors V - Microsystem for measurement of impedance sensors parameters

Hoja, Jerzy; Lentka, Grzegorz; Kalita, Wlodzimierz
  • 作者Hoja, Jerzy; Lentka, Grzegorz; Kalita, Wlodzimierz
  • 卷第5124卷
  • 印刷ISSN0277-786X
  • 文件大小539.62KB
  • 发表时间2003
  • DOI10.1117/12.517130
  • 页码283-290
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