SPIE Proceedings [SPIE NDE for Health Monitoring and Diagnostics - San Diego, CA (Sunday 2 March 2003)] Testing, Reliability, and Application of Micro- and Nano-Material Systems - Imaging the microstructure of copper with the atomic force microscope (AFM) and ultrasonic force microscope (UFM)
Druffner, Carl J.; Schumaker, Edward J.; Murray, Paul T.; Sathish, Shamachary; Meyendorf, Norbert; Baaklini, George Y.; Michel, Bernd
- 作者Druffner, Carl J.; Schumaker, Edward J.; Murray, Paul T.; Sathish, Shamachary; Meyendorf, Norbert; Baaklini, George Y.; Michel, Bernd
- 卷第5045卷
- 印刷ISSN0277-786X
- 文件大小430.01KB
- 发表时间2003
- DOI10.1117/12.483824
- 页码122-131