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$Structural study of SiC(0 0 0 1)3×3 surface by surface X-ray diffraction$

Structural study of SiC(0 0 0 1)3×3 surface by surface X-ray diffraction

T. Aoyama; K. Akimoto; A. Ichimiya; Y. Hisada; S. Mukainakano; T. Emoto; H. Tajiri; T. Takahashi; H. Sugiyama; X. Zhang; H. Kawata

作者T. Aoyama; K. Akimoto; A. Ichimiya; Y. Hisada; S. Mukainakano; T. Emoto; H. Tajiri; T. Takahashi; H. Sugiyama; X. Zhang; H. Kawata
卷第216卷
印刷ISSN0169-4332
文件大小277.15KB
发表时间2003
DOI10.1016/s0169-4332(03)00431-8
页码356-360

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