Estimates of medical device–associated adverse events from emergency departments
Brockton J. Hefflin; Thomas P. Gross; Thomas J. Schroeder
- 作者Brockton J. Hefflin; Thomas P. Gross; Thomas J. Schroeder
- 卷第27卷
- 期第3期
- 印刷ISSN0749-3797
- 文件大小95.69KB
- 发表时间2004
- DOI10.1016/j.amepre.2004.04.005