Extended auxiliary problem principle using Bregman distances
- 期刊名称Optimization
- 作者Kaplan, A.; Tichatschke, R.
- 卷第53卷
- 印刷ISSN0233-1934
- 电子ISSN1029-4945
- 文件大小214.62KB
- 发表时间2004-10
- DOI10.1080/02331930412331326301
- 页码603-623
Scanning Electron Microscopy and X-ray Microanalysis ||Goldstein, Joseph I.; Newbury, Dale E.; Echlin, Patrick; Joy, David C.; Lyman, Charles E.; Lifshin, Eric; Sawyer, Linda; Michael, Joseph R. · 2003
Scanning Electron Microscopy and X-ray Microanalysis || IntroductionGoldstein, Joseph I.; Newbury, Dale E.; Echlin, Patrick; Joy, David C.; Lyman, Charles E.; Lifshin, Eric; Sawyer, Linda; Michael, Joseph R. · 2003
Scanning Electron Microscopy and X-ray Microanalysis || Image Formation and InterpretationGoldstein, Joseph I.; Newbury, Dale E.; Echlin, Patrick; Joy, David C.; Lyman, Charles E.; Lifshin, Eric; Sawyer, Linda; Michael, Joseph R. · 2003
Scanning Electron Microscopy and X-ray Microanalysis || Qualitative X-Ray AnalysisGoldstein, Joseph I.; Newbury, Dale E.; Echlin, Patrick; Joy, David C.; Lyman, Charles E.; Lifshin, Eric; Sawyer, Linda; Michael, Joseph R. · 2003
Scanning Electron Microscopy and X-ray Microanalysis || Low-Temperature Specimen PreparationGoldstein, Joseph I.; Newbury, Dale E.; Echlin, Patrick; Joy, David C.; Lyman, Charles E.; Lifshin, Eric; Sawyer, Linda; Michael, Joseph R. · 2003
Scanning Electron Microscopy and X-ray Microanalysis || Specimen Preparation of Polymer MaterialsGoldstein, Joseph I.; Newbury, Dale E.; Echlin, Patrick; Joy, David C.; Lyman, Charles E.; Lifshin, Eric; Sawyer, Linda; Michael, Joseph R. · 2003
Scanning Electron Microscopy and X-ray Microanalysis || Special Topics in Scanning Electron MicroscopyGoldstein, Joseph I.; Newbury, Dale E.; Echlin, Patrick; Joy, David C.; Lyman, Charles E.; Lifshin, Eric; Sawyer, Linda; Michael, Joseph R. · 2003