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[IEEE 2004 International Symposium on Electromagnetic Compatibility - Silicon Valley, CA, USA (9-13 Aug. 2004)] 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) - Complex fit normalized site attenuation using complex magnitude and phase patterns

[IEEE 2004 International Symposium on Electromagnetic Compatibility - Silicon Valley, CA, USA (9-13 Aug. 2004)] 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) - Complex fit normalized site attenuation using complex magnitude and phase patterns

Zhong Chen, ; Foegelle, M.

作者Zhong Chen, ; Foegelle, M.
文件大小284.26KB
发表时间2004
DOI10.1109/ISEMC.2004.1349914
页码747-751

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