发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

[IEEE 2004 International Symposium on Electromagnetic Compatibility - Silicon Valley, CA, USA (9-13 Aug. 2004)] 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) - Dynamically linked EM/circuit analysis methodology

[IEEE 2004 International Symposium on Electromagnetic Compatibility - Silicon Valley, CA, USA (9-13 Aug. 2004)] 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) - Dynamically linked EM/circuit analysis methodology

Randhawa, H.; Williams, L.

作者Randhawa, H.; Williams, L.
文件大小322.83KB
发表时间2004
DOI10.1109/ISEMC.2004.1349936
页码860-863

← 返回【学霸图书馆】主页