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[IEEE 2004 IEEE MTT-S International Microwave Symposium Digest - Fort Worth, TX, USA (6-11 June 2004)] 2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535) - Full-wave boundary contour mode-matching analysis and CAD of cavities with partial height post and rounded corners for sophisticated conductor loaded cavity and combline filter designs

[IEEE 2004 IEEE MTT-S International Microwave Symposium Digest - Fort Worth, TX, USA (6-11 June 2004)] 2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535) - Full-wave boundary contour mode-matching analysis and CAD of cavities with partial height post and rounded corners for sophisticated conductor loaded cavity and combline filter designs

Reiter, J.M.; Beyer, R.; Rosenberg, U.
  • 作者Reiter, J.M.; Beyer, R.; Rosenberg, U.
  • 文件大小393.91KB
  • 发表时间2004
  • DOI10.1109/mwsym.2004.1338968
  • 页码1855-1858
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