Timing Vulnerability Factors of Sequentials
- 期刊名称IEEE Transactions on Device and Materials Reliability
- 作者Seifert, N.; Tam, N.
- 卷第4卷
- 期第3期
- 印刷ISSN1530-4388
- 文件大小274.72KB
- 发表时间2004-09
- DOI10.1109/TDMR.2004.831993
- 页码516-522
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