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Vacancy-related defect distributions in [sup 11]B-, [sup 14]N-, and [sup 27]Al-implanted 4H–SiC: Role of channeling

Vacancy-related defect distributions in [sup 11]B-, [sup 14]N-, and [sup 27]Al-implanted 4H–SiC: Role of channeling

Janson, M. S.
  • 期刊名称Journal of Applied Physics
  • 作者Janson, M. S.
  • 卷第95卷
  • 期第1期
  • 印刷ISSN0021-8979
  • 文件大小346.19KB
  • 发表时间2004
  • DOI10.1063/1.1630359
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