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[IEEE 10th International Symposium on Asynchronous Circuits and Systems, 2004. - Crete, Greece (19-23 April 2004)] 10th International Symposium on Asynchronous Circuits and Systems, 2004. Proceedings. - General testers for asynchronous circuits

[IEEE 10th International Symposium on Asynchronous Circuits and Systems, 2004. - Crete, Greece (19-23 April 2004)] 10th International Symposium on Asynchronous Circuits and Systems, 2004. Proceedings. - General testers for asynchronous circuits

Negulescu, R.

作者Negulescu, R.
文件大小1436.12KB
发表时间2004
DOI10.1109/async.2004.1299285
页码28-38

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