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Structural characterization of polycrystalline Sb2O3 thin films prepared by thermal vacuum evaporation technique

Structural characterization of polycrystalline Sb2O3 thin films prepared by thermal vacuum evaporation technique

N. Tigau; V. Ciupina; G. Prodan; G.I. Rusu; E. Vasile
  • 作者N. Tigau; V. Ciupina; G. Prodan; G.I. Rusu; E. Vasile
  • 卷第269卷
  • 印刷ISSN0022-0248
  • 文件大小816.14KB
  • 发表时间2004
  • DOI10.1016/j.jcrysgro.2004.05.052
  • 页码392-400
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