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[IEEE 2004 IEEE International Conference on Systems, Man and Cybernetics (IEEE Cat. No.04CH37583) - The Hague, Netherlands (Oct. 10-13, 2004)] 2004 IEEE International Conference on Systems, Man and Cybernetics (IEEE Cat. No.04CH37583) - A discrete event systems approach to online testing of digital VLSI circuits

[IEEE 2004 IEEE International Conference on Systems, Man and Cybernetics (IEEE Cat. No.04CH37583) - The Hague, Netherlands (Oct. 10-13, 2004)] 2004 IEEE International Conference on Systems, Man and Cybernetics (IEEE Cat. No.04CH37583) - A discrete event systems approach to online testing of digital VLSI circuits

Biswas, S.; Mukhopadhyay, S.; Patra, A.
  • 作者Biswas, S.; Mukhopadhyay, S.; Patra, A.
  • 卷第2卷
  • 文件大小424.41KB
  • 发表时间2004
  • DOI10.1109/ICSMC.2004.1399876
  • 页码1699-1704
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