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[ACM Press the 41st annual conference - San Diego, CA, USA (2004.06.07-2004.06.11)] Proceedings of the 41st annual conference on Design automation - DAC '04 - Parametric yield estimation considering leakage variability

[ACM Press the 41st annual conference - San Diego, CA, USA (2004.06.07-2004.06.11)] Proceedings of the 41st annual conference on Design automation - DAC '04 - Parametric yield estimation considering leakage variability

Rao, Rajeev R.; Devgan, Anirudh; Blaauw, David; Sylvester, Dennis

作者Rao, Rajeev R.; Devgan, Anirudh; Blaauw, David; Sylvester, Dennis
文件大小869.92KB
发表时间2004
DOI10.1145/996566.996693

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