Test EBIS operation and component development for the RHIC EBIS*
Beebe, Edward N; Alessi, James G; Graham, David; Kponou, Ahovi; Pikin, Alexander; Prelec, Krsto; Ritter, John; Zajic, Vladimir
- 期刊名称Journal of Physics: Conference Series
- 作者Beebe, Edward N; Alessi, James G; Graham, David; Kponou, Ahovi; Pikin, Alexander; Prelec, Krsto; Ritter, John; Zajic, Vladimir
- 卷第2卷
- 印刷ISSN1742-6588
- 电子ISSN1742-6596
- 文件大小182.78KB
- 发表时间2004-01-01
- DOI10.1088/1742-6596/2/1/020
- 页码164-173