Valence Loss Mapping in Electron Microscopy
- 期刊名称Microscopy and Microanalysis
- 作者Howie, Archie; Garcia de Abajo, Francisco Javier
- 卷第10卷
- 印刷ISSN1431-9276
- 电子ISSN1435-8115
- 文件大小140.36KB
- 发表时间2004-8
- DOI10.1017/s1431927604880115
- 页码266-267
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