SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 26 April 2004)] Optical Metrology in Production Engineering - Digital holographic microscopy applied to metrology

Depeursinge, Christian D.; Osten, Wolfgang; Takeda, Mitsuo; Charriere, Florian; Marian, Anca M.; Montfort, Frederic; Colomb, Tristan; Kuhn, Jonas; Cuche, Etienne; Emery, Yves; Marquet, Pierre; Magistretti, Pierre J.

作者Depeursinge, Christian D.; Osten, Wolfgang; Takeda, Mitsuo; Charriere, Florian; Marian, Anca M.; Montfort, Frederic; Colomb, Tristan; Kuhn, Jonas; Cuche, Etienne; Emery, Yves; Marquet, Pierre; Magistretti, Pierre J.
卷第5457卷
印刷ISSN0277-786X
文件大小411.03KB
发表时间2004
DOI10.1117/12.546014

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SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 26 April 2004)] Optical Metrology in Production Engineering - Digital holographic microscopy applied to metrology