SPIE Proceedings [SPIE NDE for Health Monitoring and Diagnostics - San Diego, CA (Sunday 14 March 2004)] Testing, Reliability, and Application of Micro- and Nano-Material Systems II - High-resolution nondestructive evaluation at the Center for Materials Diagnosis
- 作者Meyendorf, Norbert; Meyendorf, Norbert; Baaklini, George Y.; Sathish, Shamachary; Druffner, Carl J.; Michel, Bernd; Blackshire, James L.; Hoffmann, Jochen P.; Zhan, Qiwen; Andrews, Robert J.
- 卷第5392卷
- 印刷ISSN0277-786X
- 文件大小403.17KB
- 发表时间2004
- DOI10.1117/12.541351
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