海量图书期刊资源，随时随地畅享阅读乐趣
[IEEE 2019 IEEE International Conference On Artificial Intelligence Testing (AITest) - Newark, CA, USA (2019.4.4-2019.4.9)] 2019 IEEE International Conference On Artificial Intelligence Testing (AITest) - Fault Detection Effectiveness of Metamorphic Relations Developed for Testing Supervised ClassifiersSaha, Prashanta; Kanewala, Upulee · 2019