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[IEEE 11th IEEE International On-Line Testing Symposium - French Riviera, France (2005.07.8-2005.07.8)] 11th IEEE International On-Line Testing Symposium - Yield Prediction of High Performance Pipelined Circuit with Respect to Delay Failures in Sub-100nm Technology

[IEEE 11th IEEE International On-Line Testing Symposium - French Riviera, France (2005.07.8-2005.07.8)] 11th IEEE International On-Line Testing Symposium - Yield Prediction of High Performance Pipelined Circuit with Respect to Delay Failures in Sub-100nm Technology

Datta, A.; Mukhopadhyay, S.; Bhunia, S.; Roy, K.

作者Datta, A.; Mukhopadhyay, S.; Bhunia, S.; Roy, K.
文件大小854.81KB
发表时间2005
DOI10.1109/IOLTS.2005.71
页码275-280

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