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[IEEE 2005 IEEE International Workshop on Current and Defect Based Testing, 2005. DBT 2005. - Palm Spring, CA, USA (May 1, 2005)] Proceedings. 2005 IEEE International Workshop on Current and Defect Based Testing, 2005. DBT 2005. - Electrical analysis of a domino logic cell with GOS faults

[IEEE 2005 IEEE International Workshop on Current and Defect Based Testing, 2005. DBT 2005. - Palm Spring, CA, USA (May 1, 2005)] Proceedings. 2005 IEEE International Workshop on Current and Defect Based Testing, 2005. DBT 2005. - Electrical analysis of a domino logic cell with GOS faults

Comte, M.; Ohtake, S.; Fujiwara, H.; Renovell, M.

作者Comte, M.; Ohtake, S.; Fujiwara, H.; Renovell, M.
文件大小659.58KB
发表时间2005
DOI10.1109/dbt.2005.1531299
页码31-38

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