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[IEEE 2005 IEEE International SOI - Honolulu, HI, USA (03-06 Oct. 2005)] 2005 IEEE International SOI Conference Proceedings - Circuit to Measure High Speed Pulse I-V Characteristics with Only DC I/O's

[IEEE 2005 IEEE International SOI - Honolulu, HI, USA (03-06 Oct. 2005)] 2005 IEEE International SOI Conference Proceedings - Circuit to Measure High Speed Pulse I-V Characteristics with Only DC I/O's

Bhushan, M.; Ketchen, M.B.; Jenkins, K.A.

作者Bhushan, M.; Ketchen, M.B.; Jenkins, K.A.
文件大小351.43KB
发表时间2005
DOI10.1109/soi.2005.1563540
页码77-78

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