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[IEEE 14th Asian Test Symposium (ATS'05) - Calcutta, India (2005.12.21-2005.12.21)] 14th Asian Test Symposium (ATS'05) - A Statistical Approach to Area-Constrained Yield Enhancement for Pipelined Circuits under Parameter Variations

[IEEE 14th Asian Test Symposium (ATS'05) - Calcutta, India (2005.12.21-2005.12.21)] 14th Asian Test Symposium (ATS'05) - A Statistical Approach to Area-Constrained Yield Enhancement for Pipelined Circuits under Parameter Variations

Datta, A.; Bhunia, S.; Mukhopadhyay, S.; Roy, K.

作者Datta, A.; Bhunia, S.; Mukhopadhyay, S.; Roy, K.
文件大小276.83KB
发表时间2005
DOI10.1109/ats.2005.16
页码170-175

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