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Characterization of the location and interfacial states of gallium in gallium/MCM-41 composites

Characterization of the location and interfacial states of gallium in gallium/MCM-41 composites

Weiping Zhang; Christopher I. Ratcliffe; Igor L. Moudrakovski; John S. Tse; Chung-Yuan Mou; John A. Ripmeester
  • 作者Weiping Zhang; Christopher I. Ratcliffe; Igor L. Moudrakovski; John S. Tse; Chung-Yuan Mou; John A. Ripmeester
  • 卷第79卷
  • 印刷ISSN1387-1811
  • 文件大小352.97KB
  • 发表时间2005
  • DOI10.1016/j.micromeso.2004.11.005
  • 页码195-203
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