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Coupled analysis between X-ray scattering and birefringence on an ionomer film

Coupled analysis between X-ray scattering and birefringence on an ionomer film

P.C. van der Heijden; O. Diat

作者P.C. van der Heijden; O. Diat
卷第238卷
印刷ISSN0168-583X
文件大小255.04KB
发表时间2005
DOI10.1016/j.nimb.2005.06.016
页码43-49

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