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[IEEE IEEE MTT-S International Microwave Symposium Digest, 2005. - Long Beach, CA, USA (12-17 June 2005)] IEEE MTT-S International Microwave Symposium Digest, 2005. - A new multiport measurement-method using a two-port network analyzer

[IEEE IEEE MTT-S International Microwave Symposium Digest, 2005. - Long Beach, CA, USA (12-17 June 2005)] IEEE MTT-S International Microwave Symposium Digest, 2005. - A new multiport measurement-method using a two-port network analyzer

Lenk, F.; Doerner, R.

作者Lenk, F.; Doerner, R.
文件大小258.64KB
发表时间2005
DOI10.1109/mwsym.2005.1517031
页码1663-1666

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