Reliability evaluation of Nb 10 kA/cm2 fabrication process for large-scale SFQ circuits
- 作者S. Nagasawa; K. Hinode; T. Satoh; H. Akaike; Y. Kitagawa; M. Hidaka
- 印刷ISSN0921-4534
- 文件大小639.87KB
- 发表时间2005
- DOI10.1016/j.physc.2005.03.058
- 页码1525-1532
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