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[IEEE Design, Automation and Test in Europe - Munich, Germany (07-11 March 2005)] Design, Automation and Test in Europe - Statistical Modeling of Pipeline Delay and Design of Pipeline under Process Variation to Enhance Yield in sub-100nm Technologies

[IEEE Design, Automation and Test in Europe - Munich, Germany (07-11 March 2005)] Design, Automation and Test in Europe - Statistical Modeling of Pipeline Delay and Design of Pipeline under Process Variation to Enhance Yield in sub-100nm Technologies

Datta, A.; Bhunia, S.; Mukhopadhyay, S.; Banerjee, N.; Roy, K.

作者Datta, A.; Bhunia, S.; Mukhopadhyay, S.; Banerjee, N.; Roy, K.
文件大小212.28KB
发表时间2005
DOI10.1109/date.2005.278
页码926-931

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