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[IEEE The Fifth International Conference on Computer and Information Technology (CIT'05) - Shanghai, China (2005.09.21-2005.09.23)] The Fifth International Conference on Computer and Information Technology (CIT'05) - AICTO: an improved algorithm for planning inter-class test order

[IEEE The Fifth International Conference on Computer and Information Technology (CIT'05) - Shanghai, China (2005.09.21-2005.09.23)] The Fifth International Conference on Computer and Information Technology (CIT'05) - AICTO: an improved algorithm for planning inter-class test order

Chengying Mao, ; Yansheng Lu,

作者Chengying Mao, ; Yansheng Lu,
文件大小198.45KB
发表时间2005
DOI10.1109/cit.2005.59
页码927-931

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