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[IEEE Design, Automation and Test in Europe - Munich, Germany (07-11 March 2005)] Design, Automation and Test in Europe - Modeling Interconnect Variability Using Efficient Parametric Model Order Reduction

[IEEE Design, Automation and Test in Europe - Munich, Germany (07-11 March 2005)] Design, Automation and Test in Europe - Modeling Interconnect Variability Using Efficient Parametric Model Order Reduction

Peng Li, ; Liu, F.; Xin Li, ; Pileggi, L.T.; Nassif, S.R.

作者Peng Li, ; Liu, F.; Xin Li, ; Pileggi, L.T.; Nassif, S.R.
文件大小233.21KB
发表时间2005
DOI10.1109/date.2005.213
页码958-963

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