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[IEEE IEEE International Conference on Test, 2005. - Charlotte, NC, USA (Nov. 8, 2005)] IEEE International Conference on Test, 2005. - The ITC test compression shootout

[IEEE IEEE International Conference on Test, 2005. - Charlotte, NC, USA (Nov. 8, 2005)] IEEE International Conference on Test, 2005. - The ITC test compression shootout

Davidson, S.

作者Davidson, S.
文件大小122.44KB
发表时间2005
DOI10.1109/test.2005.1584110
页码1283-1283

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