[IEEE 2005 42nd Design Automation Conference - Anaheim, CA, USA (2005.06.13-2005.06.17)] Proceedings. 42nd Design Automation Conference, 2005. - Secure scan: a design-for-test architecture for crypto chips
- 作者Bo Yang, ; Kaijie Wu, ; Karri, R.
- 文件大小1064.23KB
- 发表时间2005
- DOI10.1109/dac.2005.193787
- 页码135-140
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