Einzelelektronen-Schaltungen für Anwendungen in der Metrologie (Single-Electron Circuits for Metrological Applications)
- 期刊名称tm - Technisches Messen
- 作者Scherer, Hansjörg
- 卷第72卷
- 印刷ISSN0171-8096
- 文件大小333.98KB
- 发表时间2005-01-01
- DOI10.1524/teme.72.4.223.62920
Characterization of microlenses by digital holographic microscopyCharrière, Florian; Kühn, Jonas; Colomb, Tristan; Montfort, Frédéric; Cuche, Etienne; Emery, Yves; Weible, Kenneth; Marquet, Pierre; Depeursinge, Christian · ao/45/5/ao-45-5-829.pdf · 2006
Cell refractive index tomography by digital holographic microscopyCharrière, Florian; Marian, Anca; Montfort, Frédéric; Kuehn, Jonas; Colomb, Tristan; Cuche, Etienne; Marquet, Pierre; Depeursinge, Christian · ol/31/2/ol-31-2-178.pdf · 2006
Submicrometer optical tomography by multiple-wavelength digital holographic microscopyCharrière, Florian; Kühn, Jonas; Marquet, Pierre; Cuche, Etienne; Herminjard, Sylvain; Depeursinge, Christian; Montfort, Frédéric; Colomb, Tristan · ao/45/32/ao-45-32-8209.pdf · 2006
Real-time dual-wavelength digital holographic microscopy with a single hologram acquisitionKühn, Jonas; Colomb, Tristan; Montfort, Frédéric; Charrière, Florian; Emery, Yves; Cuche, Etienne; Marquet, Pierre; Depeursinge, Christian · oe/15/12/oe-15-12-7231.pdf · 2007
Numerical parametric lens for shifting, magnification, and complete aberration compensation in digital holographic microscopyColomb, Tristan; Montfort, Frédéric; Kühn, Jonas; Aspert, Nicolas; Cuche, Etienne; Marian, Anca; Charrière, Florian; Bourquin, Sébastien; Marquet, Pierre; Depeursinge, Christian · josaa/23/12/josaa-23-12-3177.pdf · 2006
Automatic procedure for aberration compensation in digital holographic microscopy and applications to specimen shape compensationColomb, Tristan; Cuche, Etienne; Charrière, Florian; Kühn, Jonas; Aspert, Nicolas; Montfort, Frédéric; Marquet, Pierre; Depeursinge, Christian · ao/45/5/ao-45-5-851.pdf · 2006
Shot-noise influence on the reconstructed phase image signal-to-noise ratio in digital holographic microscopyCharrière, Florian; Colomb, Tristan; Montfort, Frédéric; Cuche, Etienne; Marquet, Pierre; Depeursinge, Christian · ao/45/29/ao-45-29-7667.pdf · 2006
Purely numerical compensation for microscope objective phase curvature in digital holographic microscopy: influence of digital phase mask positionMontfort, Frédéric; Charrière, Florian; Colomb, Tristan; Cuche, Etienne; Marquet, Pierre; Depeursinge, Christian · josaa/23/11/josaa-23-11-2944.pdf · 2006
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