SPIE Proceedings [SPIE Optical Systems Design 2005 - Jena, Germany (Monday 12 September 2005)] Detectors and Associated Signal Processing II - Bessel beam based optical profilometry
- 作者Belyi, V.; Chatard, Jean-Pierre; Dennis, Peter N. J.; Kroening, M.; Kazak, N.; Khilo, N.; Mashchenko, A.; Ropot, P.
- 卷第5964卷
- 印刷ISSN0277-786X
- 文件大小537.31KB
- 发表时间2005
- DOI10.1117/12.624491
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