Defect-tolerant demultiplexers for nano-electronics constructed from error-correcting codes
P.J. Kuekes; W. Robinett; G. Seroussi; R. Stanley Williams
- 作者P.J. Kuekes; W. Robinett; G. Seroussi; R. Stanley Williams
- 卷第80卷
- 期第6期
- 印刷ISSN0947-8396
- 电子ISSN1432-0630
- 文件大小195.54KB
- 发表时间2005-03
- DOI10.1007/s00339-004-3164-2
- 页码1161-1164