Popper and Synthetic judgements A Priori
- 作者Michael Drieschner
- 卷第36卷
- 期第1期
- 印刷ISSN0925-4560
- 电子ISSN1572-8587
- 文件大小132.97KB
- 发表时间2005-01
- DOI10.1007/s10838-005-6034-5
- 页码49-61
Guest Editors' Introduction: The Status of IEEE Std 1500Marinissen, Erik Jan; Zorian, Yervant · 2009
Guest Editors' Introduction: The Status of IEEE Std 1500—Part 2Marinissen, Erik Jan; Zorian, Yervant · 2009
On IEEE P1500's Standard for Embedded Core TestErik Jan Marinissen; Rohit Kapur; Maurice Lousberg; Teresa McLaurin; Mike Ricchetti; Yervant Zorian · 2002
Guest Editors’ Introduction: Design & Test of a High-Volume 3-D Stacked Graphics Processor With High-Bandwidth MemoryMarinissen, Erik Jan; Zorian, Yervant · IEEE Design & Test · 2017
[IEEE 2009 IEEE International Test Conference (ITC) - Austin, TX, USA (2009.11.1-2009.11.6)] 2009 International Test Conference - Testing 3D chips containing through-silicon viasMarinissen, Erik Jan; Zorian, Yervant · 2009
[ACM Press the 37th conference - Los Angeles, California, United States (2000.06.05-2000.06.09)] Proceedings of the 37th conference on Design automation - DAC '00 - System chip testZorian, Yervant; Marinissen, Erik Jan · 2000
[IEEE 2016 IEEE European Test Symposium (ETS) - Amsterdam, Netherlands (2016.5.23-2016.5.27)] 2016 21th IEEE European Test Symposium (ETS) - IoT: Source of test challengesMarinissen, Erik Jan; Zorian, Yervant; Konijnenburg, Mario; Chih-Tsun Huang, ; Ping-Hsuan Hsieh, ; Cockburn, Peter; Delvaux, Jeroen; Rozic, Vladimir; Bohan Yang, ; Singelee, Dave; Verbauwhede, Ingrid; Mayor, Cedric; van Rijsinge, Robert; Reyes, Cocoy · 2016