A test of enhancing model accuracy in high-throughput crystallography

W. Bryan Arendall; Wolfram Tempel; Jane S. Richardson; Weihong Zhou; Shuren Wang; Ian W. Davis; Zhi-Jie Liu; John P. Rose; W. Michael Carson; Ming Luo; David C. Richardson; Bi-Cheng Wang

作者W. Bryan Arendall; Wolfram Tempel; Jane S. Richardson; Weihong Zhou; Shuren Wang; Ian W. Davis; Zhi-Jie Liu; John P. Rose; W. Michael Carson; Ming Luo; David C. Richardson; Bi-Cheng Wang
卷第6卷
期第1期
印刷ISSN1345-711X
电子ISSN1570-0267
文件大小364.36KB
发表时间2005
DOI10.1007/s10969-005-3138-4
页码1-11

发现好书期刊，享受阅读乐趣

A test of enhancing model accuracy in high-throughput crystallography