Double screening tests of the CMS ECAL avalanche photodiodes
K. Deiters; Q. Ingram; D. Renker; T. Sakhelashvili; I. Britvitch; A. Kuznetsov; Y. Musienko; A. Singovsky
- 作者K. Deiters; Q. Ingram; D. Renker; T. Sakhelashvili; I. Britvitch; A. Kuznetsov; Y. Musienko; A. Singovsky
- 卷第543卷
- 印刷ISSN0168-9002
- 文件大小393.87KB
- 发表时间2005
- DOI10.1016/j.nima.2005.01.088
- 页码549-558