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[IEEE 2006 Bipolar/BiCMOS Circuits and Technology Meeting - Maastricht (2006.10.8-2006.10.10)] 2006 Bipolar/BiCMOS Circuits and Technology Meeting - Electrothermal Phenomena in Bipolar Transistors and ICs: Analysis, Modeling, and Simulation

[IEEE 2006 Bipolar/BiCMOS Circuits and Technology Meeting - Maastricht (2006.10.8-2006.10.10)] 2006 Bipolar/BiCMOS Circuits and Technology Meeting - Electrothermal Phenomena in Bipolar Transistors and ICs: Analysis, Modeling, and Simulation

Rinaldi, N.; d'Alessandro, V.; De Paola, F.M.

作者Rinaldi, N.; d'Alessandro, V.; De Paola, F.M.
文件大小9803.87KB
发表时间2006
DOI10.1109/bipol.2006.311153
页码1-8

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