Secure Scan: A Design-for-Test Architecture for Crypto Chips
- 作者Bo Yang; Kaijie Wu; Karri, R.
- 卷第25卷
- 期第10期
- 印刷ISSN0278-0070
- 电子ISSN1937-4151
- 文件大小206.46KB
- 发表时间2006
- DOI10.1109/tcad.2005.862745
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